書誌事項
- タイトル別名
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- 203 Dynamic WIP control management considering change of bottleneck processes in wafer manufacturing
説明
Processes in wafer manufacturing are re-entrant type, which requires long lead time. The equipment of the production line is high uncertainty, and high-mix low-volume production is increasing in the semiconductor industry. Furthermore, changes in demand are also intense. Traditionally, management approach starting with the bottleneck has been studied to increase productivity. But because the market keeps changing, it is difficult to deat with a fixed bottleneck. In this paper, we propose a method for dynamic WIP control based on the bottleneck index corresponding to the variation. Using throughput and cycle-time as the performance measures, a simulation result shows the effectiveness of the proposed method.
収録刊行物
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- 生産システム部門講演会講演論文集
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生産システム部門講演会講演論文集 2011 (0), 31-32, 2011
一般社団法人 日本機械学会
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詳細情報 詳細情報について
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- CRID
- 1390001205900005376
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- NII論文ID
- 110009619672
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- ISSN
- 24243108
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
- OpenAIRE
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- 抄録ライセンスフラグ
- 使用不可