19pBH-5 Direct observation of ultrafast electron relaxation process in wide-gap semiconductor

DOI

Bibliographic Information

Other Title
  • 19pBH-5 ワイドギャップ半導体中の超高速励起電子緩和過程の直接観測

Journal

Details 詳細情報について

  • CRID
    1390001205954368512
  • NII Article ID
    110010057462
  • DOI
    10.11316/jpsgaiyo.71.1.0_1457
  • ISSN
    21890803
  • Text Lang
    ja
  • Data Source
    • JaLC
    • CiNii Articles

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