19aCA-4 One-dimensional edge state of Bismuth thin film on Si(111)

  • Kawakami N.
    Department of Advanced Materials Science, The University of Tokyo
  • Lin C.-L.
    Department of Advanced Materials Science, The University of Tokyo
  • Kawai M.
    Department of Advanced Materials Science, The University of Tokyo
  • Arafune R.
    MANA NIMS
  • Takagi N.
    Department of Advanced Materials Science, The University of Tokyo

Bibliographic Information

Other Title
  • 19aCA-4 Si(111)上Bi薄膜の一次元エッジ状態

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Details 詳細情報について

  • CRID
    1390001205957245696
  • NII Article ID
    110010029944
  • DOI
    10.11316/jpsgaiyo.70.2.0_2362
  • ISSN
    21890803
  • Text Lang
    ja
  • Data Source
    • JaLC
    • CiNii Articles

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