Reliability Sampling Plans under Truncated Life Tests with Inverse Gaussian Data(<Special Issue>Contribution to 21 Century Intelligent Technologies and Bioinformatics)

Search this article

Description

In this paper, reliability sampling plans for truncated life tests are developed when the lifetimes of test items follow an Inverse Gaussian distribution. The proposed sampling plan can save the test time in practical situations. An algorithm is provided to establish the sampling plans, moreover, some tables are provided for the proposed sampling plans so that the proposed method can be used conveniently for the practitioners. The use of the proposed method is illustrated by examples.

Journal

Details 詳細情報について

  • CRID
    1390001206077689216
  • NII Article ID
    110006914875
  • DOI
    10.24466/ijbschs.13.1_13
  • ISSN
    2424256X
    21852421
  • Text Lang
    en
  • Data Source
    • JaLC
    • CiNii Articles
  • Abstract License Flag
    Disallowed

Report a problem

Back to top