A Discussion on QFD-based Quality Control Modeling of Embedded Software Requirement Analysis and Design(<Special Issue>Project Management for Embedded Software Development)
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- Komatsu Yukari
- NEC Corporation
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- Yoshihara Shinya
- Kyushu Institute of Technology
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- Ishibashi Keiichi
- Kyushu Institute of Technology
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- Akiyama Yoshihiro
- IBM Japan, Ltd.
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- Nakatani Takako
- Kyushu Institute of Technology:S-Lagoon Co., Ltd.
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- Katamine Keiichi
- Kyushu Institute of Technology
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- Ubayashi Naoyasu
- Kyushu Institute of Technology
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- Hashimoto Masaaki
- Kyushu Institute of Technology
Bibliographic Information
- Other Title
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- QFDによる組込みソフトウェア分析・設計の品質管理モデリングに関する一考察(<特集>組込みソフトウェア開発のPM)
- QFDによる組込みソフトウェア分析・設計の品質管理モデリングに関する一考察
- QFD ニ ヨル クミコミ ソフトウェア ブンセキ セッケイ ノ ヒンシツ カンリ モデリング ニ カンスル イチ コウサツ
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Abstract
We have enhanced ERVM (Earned Requirement Value Method) and studied a quality control model from the viewpoint of QFD-based traceability of system requirements. The study is aimed at getting the product of good quality in the requirement analysis and design phases of embedded software. One of the serious problems is the quality of requirement analysis and design in the field of embedded software development projects. Therefore, it is essential to get the good quality in the requirement analysis and design phases. If the good quality is not obtained in the requirement analysis and design phases, the project will easily fail by the rework in the implement phase and the malfunction in the operation. In this paper, we discuss the model and describe the future study.
Journal
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- Journal of the Society of Project Management
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Journal of the Society of Project Management 7 (5), 15-20, 2005
The Society of Project Management
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Keywords
Details 詳細情報について
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- CRID
- 1390001206110681728
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- NII Article ID
- 110006278246
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- NII Book ID
- AA11391448
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- ISSN
- 24333069
- 1345031X
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- HANDLE
- 10228/2334
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- NDL BIB ID
- 8049004
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- Text Lang
- ja
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- Data Source
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- JaLC
- IRDB
- NDL
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed