Oscillations in Magnetoresistance in Epitaxial (100) and (111) NiFe / Cu Multilayers.

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  • Kawawake Yasuhiro
    Central Research Laboratories, Matsushita Electric Industrial Co., Ltd., Hikari–dai, Seika–cho, Soraku–gun, Kyoto 619–02
  • Sakakima Hiroshi
    Central Research Laboratories, Matsushita Electric Industrial Co., Ltd., Hikari–dai, Seika–cho, Soraku–gun, Kyoto 619–02
  • Irie Yousuke
    Central Research Laboratories, Matsushita Electric Industrial Co., Ltd., Hikari–dai, Seika–cho, Soraku–gun, Kyoto 619–02
  • Satomi Mitsuo
    Central Research Laboratories, Matsushita Electric Industrial Co., Ltd., Hikari–dai, Seika–cho, Soraku–gun, Kyoto 619–02

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Multilayers (MLs) of NiFe/Cu with (100) and (111) orientation were epitaxially grown on Si(100)/Cu and Si(111)/Ag/Cu substrates, respectively. The RKKY-like oscillations of magnetoresistance ratios were observed in the epitaxial NiFe/Cu MLs with the Cu spacer layer thickness (t Cu). The (100)-oriented NiFe/Cu MLs showed maxima at t Cu=0.9, 1.6, 2.0 and 2.5 nm, while the (111)-oriented MLs showed maxima at t Cu=0.9 and 1.9 nm.

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