Damage to YBa<sub>2</sub>Cu<sub>3</sub>O<sub>y</sub> Surface Caused by Ar Ion Beam Etching
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- Matsui Toshiyuki
- Euji Electric Corporate Research and Development, Ltd., 2–2–1 Nagasaka, Yokosuka 240–01, Japan
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- Yamaguchi Dabide
- Euji Electric Corporate Research and Development, Ltd., 2–2–1 Nagasaka, Yokosuka 240–01, Japan
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- Kamijo Hiroshi
- Euji Electric Corporate Research and Development, Ltd., 2–2–1 Nagasaka, Yokosuka 240–01, Japan
書誌事項
- タイトル別名
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- Damage to YBa2Cu3Oy Surface Caused by Ar Ion Beam Etching.
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説明
We studied transport properties through a YBa2Cu3Oy (YBCO) surface etched by exposure of the YBCO surface to an Ar ion beam. In layered junctions of Au/(100)-oriented YBCO with the etched surface, Poole-Frenkel emission was detected by analyzing current-voltage curves. This suggests that a relatively thick insulating layer was formed on the YBCO surface by damage resulting from the Ar ion beam etching.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 35 (1B), L97-L99, 1996
The Japan Society of Applied Physics
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キーワード
詳細情報 詳細情報について
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- CRID
- 1390001206245854080
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- NII論文ID
- 110003924965
- 130004522281
- 210000040688
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- NII書誌ID
- AA10650595
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- ISSN
- 13474065
- 00214922
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可