Optical Characterization of Si1-xCx/Si (0.LEQ.x.LEQ.0.014) Semiconductor Alloys.
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- Lee Hosun
- Sandia National Laboratories, P.O. Box 5800, Albuquerque, NM 87185–0601, USA
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- Kurtz S. R.
- Sandia National Laboratories, P.O. Box 5800, Albuquerque, NM 87185–0601, USA
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- Floro J. A.
- Sandia National Laboratories, P.O. Box 5800, Albuquerque, NM 87185–0601, USA
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- Strane J.
- Sandia National Laboratories, P.O. Box 5800, Albuquerque, NM 87185–0601, USA
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- Seager C. H.
- Sandia National Laboratories, P.O. Box 5800, Albuquerque, NM 87185–0601, USA
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- Lee S. R.
- Sandia National Laboratories, P.O. Box 5800, Albuquerque, NM 87185–0601, USA
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- Jones E. D.
- Sandia National Laboratories, P.O. Box 5800, Albuquerque, NM 87185–0601, USA
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- Nelson J. F.
- Sandia National Laboratories, P.O. Box 5800, Albuquerque, NM 87185–0601, USA
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- Mayer T.
- Sandia National Laboratories, P.O. Box 5800, Albuquerque, NM 87185–0601, USA
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- Picraux S. T.
- Sandia National Laboratories, P.O. Box 5800, Albuquerque, NM 87185–0601, USA
Bibliographic Information
- Other Title
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- Optical Characterization of Si<sub>1-x</sub>C<sub>x</sub>/Si ( 0≤x≤0.014) Semiconductor Alloys
Description
We have characterized the optical properties of heteroepitexial Si1- xC x/Si (0≤ x≤ 0.014) alloys grown on Si substrates by solid phase epitaxy using spectroscopic ellipsometry and photoluminescence. The measured dielectric function confirms that the samples are of good crystalline quality. The 14-K photoluminescence spectra of Si1- xC x/Si show several defect peaks. After hydrogen passivation, we observed a new peak near 1.15-1.17 eV which increases in energy with the incorporation of carbon. We tentatively assign this peak to the no-phonon peak of the Si1- xC x epi-layer. We discuss the alloy shift of the observed spectroscopic features in terms of the C-induced change in the Si indirect band gap.
Journal
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 34 (10B), L1340-L1343, 1995
The Japan Society of Applied Physics
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Details 詳細情報について
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- CRID
- 1390001206246654720
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- NII Article ID
- 130004520746
- 210000038476
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- ISSN
- 13474065
- 00214922
- http://id.crossref.org/issn/13474065
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- Text Lang
- en
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- Data Source
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- JaLC
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed