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Optical Confinement in Thin Film Si Solar Cells by Diffuse Reflective Substrate.
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- Shimokawa Ryuichi
- Electrotechnical Laboratory, 1–1–4 Umezono, Tsukuba–shi, Ibaraki 305, Japan
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- Ishii Kenichi
- Electrotechnical Laboratory, 1–1–4 Umezono, Tsukuba–shi, Ibaraki 305, Japan
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- Takahashi Tetsuo
- Electrotechnical Laboratory, 1–1–4 Umezono, Tsukuba–shi, Ibaraki 305, Japan
Bibliographic Information
- Other Title
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- Optical Confinement in Thin Film Si Sol
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Description
Optical confinement in thin film crystalline Si solar cells on diffuse reflective substrates has been experimentally and theoretically investigated. First, optical properties of thin film cells and reflective substrates are quantitatively characterized using the photometry technique. Furthermore, optical confinement models for practical thin film cells on reflective substrates deviating from the Lambertian law are presented, and inspected by comparing computed and experimental optical-property results of realized 4.2 µ m thin film cells. It is thus found that optical confinement is mainly determined by both reflectivity and optical diffusivity of the reflective substrates and degraded by the medium buffer-layer. Finally, we present scenarios for future technological realization of high absorption efficiency.
Journal
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 35 (6A), 3445-3456, 1996
The Japan Society of Applied Physics
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Details 詳細情報について
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- CRID
- 1390001206248074624
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- NII Article ID
- 210000039404
- 110003905270
- 30021826735
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- NII Book ID
- AA10457675
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- COI
- 1:CAS:528:DyaK28Xkt1Cisb8%3D
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- ISSN
- 13474065
- 00214922
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- NDL BIB ID
- 4059814
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- Text Lang
- en
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- Data Source
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- JaLC
- NDL Search
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed