Bias Dependence of Scanning Tunneling Microscopy Images of Sr Atoms Adsorbed on SrTiO3(100)〓×〓 Surfaces

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  • Kubo Akihiro
    The Institute of Scientific and Industrial Reseach, Osaka University
  • Tanaka Hiroyuki
    The Institute of Scientific and Industrial Reseach, Osaka University
  • Tabata Hitoshi
    The Institute of Scientific and Industrial Reseach, Osaka University
  • Matsumoto Takuya
    The Institute of Scientific and Industrial Reseach, Osaka University
  • Kawai Tomoji
    The Institute of Scientific and Industrial Reseach, Osaka University

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タイトル別名
  • Bias Dependence of Scanning Tunneling Microscopy Images of Sr Atoms Adsorbed on SrTiO3(100) .RAD.5*.RAD.5 Surfaces.
  • Bias Dependence of Scanning Tunneling M
  • Bias Dependence of Scanning Tunneling Microscopy Images of Sr Atoms Adsorbed on SrTiO<sub> 3</sub>(100) √ 5×√ 5 Surfaces

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説明

We have observsd significant bias dependence of Scanning Tunneling Microscopy (STM) images of Sr atoms adsorbed on SrTiO3(100) √5×√5 Surfaces. A large protrusion of Sr atoms is observed only for the filled states. This bias dependence is interpreted using first principles DV-Xα calculations, which give the distribution of each atomic orbital near the Fermi level.

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