Novel Single Electron Memory Device Using Metal Nano-Dots and Schottky In-Plane Gate Quantum Wire Transistors.

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  • Okada Hiroshi
    Research Center for Interface Quantum Electronics and Graduate School of Electronics and Information Engineering, Hokkaido University, Sapporo 060-8628, Japan
  • Hasegawa Hideki
    Research Center for Interface Quantum Electronics and Graduate School of Electronics and Information Engineering, Hokkaido University, Sapporo 060-8628, Japan

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Abstract

We report on the successful realization of a novel single electron memory device utilizing a Schottky in-plane gate (IPG) quantum wire transistor (QWTr) with nano Schottky metal dots whose position and size can be precisely controlled. Current-voltage (I-V) characteristics of the nano-metal dot formed on n-GaAs showed clear hysteresis which suggests charging of the nano-metal dot. A fabricated single electron memory device utilizing nano-metal dots showed clear threshold voltage shift once the bias was applied to the charging control gate of the nano-metal dot. This indicates successful memory operation of the fabricated device.

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