Challenge to Several-Tens-nm/Bit Recording Using Domain Wall Displacement Detection Medium.

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  • Yoshimura Shunji
    Optical Disc Laboratory, Giga Byte Laboratories, Home Network Company, Sony Corporation, <BR> 6–7–35 Kitashinagawa, Shinagawa Tokyo 141-0001, Japan
  • Fukumoto Atsushi
    Optical Disc Laboratory, Giga Byte Laboratories, Home Network Company, Sony Corporation, <BR> 6–7–35 Kitashinagawa, Shinagawa Tokyo 141-0001, Japan

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説明

We have examined two unique data error causes for domain wall displacement detection (DWDD) media, dropout and bit shift, using 8–9 modulation and (1, 7)-RLL modulation. We have determined that dropout depends only on the mark length of recorded data, while the deviation of edge shifts, which causes bit shifts, maintains approximately the same value regardless of mark length. Using these characteristics of error causes, we have also shown a prospect of achieving several-tens-nm/bit recordings.

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