Noise Properties of (Hg0.9Re0.1)Ba2CaCu2Oy Dc Superconducting Quantum Interference Device on (LaAlO3)0.3-(SrAl0.5Ta0.5O3)0.7 Substrates.
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- Inoue Nobuyoshi
- Superconductivity Research Laboratory, International Superconductivity Technology Center, 1-10-13 Shinonome, Koto-ku, Tokyo 135-0062, Japan
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- Tsukamoto Akira
- Advanced Research Laboratory, Hitachi, Ltd., Kokubunji, Tokyo 185-8601, Japan
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- Sugano Tsuyoshi
- Superconductivity Research Laboratory, International Superconductivity Technology Center, 1-10-13 Shinonome, Koto-ku, Tokyo 135-0062, Japan
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- Ogawa Akihiro
- Superconductivity Research Laboratory, International Superconductivity Technology Center, 1-10-13 Shinonome, Koto-ku, Tokyo 135-0062, Japan
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- Adachi Seiji
- Superconductivity Research Laboratory, International Superconductivity Technology Center, 1-10-13 Shinonome, Koto-ku, Tokyo 135-0062, Japan
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- Takagi Kazumasa
- Advanced Research Laboratory, Hitachi, Ltd., Kokubunji, Tokyo 185-8601, Japan
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- Tanabe Keiichi
- Superconductivity Research Laboratory, International Superconductivity Technology Center, 1-10-13 Shinonome, Koto-ku, Tokyo 135-0062, Japan
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説明
(Hg0.9Re0.1)Ba2CaCu2Oy ((Hg, Re)-1212) grain-boundary junctions (GBJs) and dc superconducting quantum interference devices (SQUIDs) were fabricated on (LaAlO3)0.3-(SrAl0.5Ta0.5O3)0.7 (LSAT) bicrystal substrates and their electrical properties at 77 K were evaluated. It was confirmed that the GBJs exhibited little excess current and homogeneous current distribution. The 1/ƒ noise of 2× 10-5 Φ0/Hz1/2 at 1 Hz in an ac bias scheme and the white flux noise of 8× 10-6 Φ0/Hz1/2 were obtained. These noise values are substantially lower than that of (Hg, Re)-1212 SQUIDs previously fabricated on SrTiO3 (STO) and comparable to that of SQUIDs made of high-quality YBa2Cu3Oy thin films. This improvment of the flux noise can be attributed to the GBJs on LSAT much more homogeneous than those on STO substrates.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 41 (10B), L1149-L1151, 2002
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1390001206254673024
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- NII論文ID
- 210000052549
- 110004080919
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- NII書誌ID
- AA10650595
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- ISSN
- 13474065
- 00214922
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- NDL書誌ID
- 6334212
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDLサーチ
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