A Theoretical Study on the Realistic Low Concentration Doping in Silicon Semiconductors by Accelerated Quantum Chemical Molecular Dynamics Method
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- Yokosuka Toshiyuki
- Department of Materials Chemistry, Graduate School of Engineering, Tohoku University
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- Sasata Katsumi
- Department of Materials Chemistry, Graduate School of Engineering, Tohoku University
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- Kurokawa Hitoshi
- Department of Materials Chemistry, Graduate School of Engineering, Tohoku University
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- Takami Seiichi
- Department of Materials Chemistry, Graduate School of Engineering, Tohoku University
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- Kubo Momoji
- Department of Materials Chemistry, Graduate School of Engineering, Tohoku University
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- Imamura Akira
- Department of Mathematics, Faculty of Engineering, Hiroshima Kokusai Gakuin University
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- Kitahara Yoshiyuki
- Corporate Manufacturing Engineering Center, Toshiba Corporation
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- Kanoh Masaaki
- Corporate Manufacturing Engineering Center, Toshiba Corporation
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- Miyamoto Akira
- Department of Materials Chemistry, Graduate School of Engineering, Tohoku University New Industry Creation Hatchery Center, Tohoku University
書誌事項
- タイトル別名
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- Theoretical Study on the Realistic Low Concentration Doping in Silicon Semiconductors by Accelerated Quantum Chemical Molecular Dynamics Method
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説明
We present a theoretical study of the structural and electronic properties of a realistic low concentration (<0.5%) doping model in silicon semiconductor. The density of states was calculated using our newly developed accelerated quantum chemical molecular dynamics method, based on our original tight-binding theory. Using this approach, the band structures of large-size silicon model including n-type and p-type dopants were successfully simulated. The results are in good agreement with the experimental results. Furthermore, we also performed quantum chemical molecular dynamics simulation of the dopants in silicon and observed the change of the dopant levels during the simulation. These results clearly suggest that our original quantum chemical molecular dynamics program is a very effective tool for not only the band structure of a realistically low concentration dopant model but also for the electronic states dynamics of silicon semiconductors.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 42 (4B), 1877-1881, 2003
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1390001206255999744
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- NII論文ID
- 130004530726
- 30021865071
- 10010800572
- 210000053194
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- NII書誌ID
- AA10457675
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- ISSN
- 13474065
- 00214922
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- NDL書誌ID
- 6523018
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- 本文言語コード
- en
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- NDLサーチ
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