Molecular Ferroelectricity of Vinylidene Fluoride Oligomer Investigated by Atomic Force Microscopy.
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- Noda Kei
- Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Sakyo-ku, Kyoto 606-8501, Japan
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- Ishida Kenji
- Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Sakyo-ku, Kyoto 606-8501, Japan
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- Kubono Atsushi
- Department of Polymer Science and Engineering, Kyoto Institute of Technology, Sakyo-ku, Kyoto 606-8585, Japan
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- Horiuchi Toshihisa
- Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Sakyo-ku, Kyoto 606-8501, Japan
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- Yamada Hirofumi
- Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Sakyo-ku, Kyoto 606-8501, Japan
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- Matsushige Kazumi
- Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Sakyo-ku, Kyoto 606-8501, Japan
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説明
Nanometer-scale electrical properties of local ferroelectric domains formed in thin films of newly synthesized vinylidene fluoride (VDF) oligomer were investigated by atomic force microscopy (AFM). Local poling and observation of the piezoelectric response revealed that the polarized domains were reversibly formed and erased in a nanometer-thick film by applying dc or pulse voltages between the electrically conductive AFM tip and the bottom electrode. The formed domain size depends on the pulse poling conditions and increases when the magnitude and the duration of a pulse voltage are increased. A local domain with a diameter of 65 nm was successfully created. The results in this work are comparable to those of previous studies performed on ferroelectric polymer thin films, suggesting that this material is one of the promising candidates for ferroelectric applications such as high-density data storages, and for molecular controls of ferroelectric properties.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 40 (6B), 4361-4364, 2001
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1390001206256033280
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- NII論文ID
- 10006388203
- 210000049751
- 130004528648
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- NII書誌ID
- AA10457675
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- ISSN
- 13474065
- 00214922
- http://id.crossref.org/issn/13474065
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- NDL書誌ID
- 5824649
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDLサーチ
- Crossref
- CiNii Articles
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- 使用不可