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- Asano Tanemasa
- Center for Microelectronic Systems, Kyushu Institute of Technology, 680-4 Kawazu, Iizuka, Fukuoka 820-8502, Japan
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- Maeda Yasuhiro
- Center for Microelectronic Systems, Kyushu Institute of Technology, 680-4 Kawazu, Iizuka, Fukuoka 820-8502, Japan
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- Nakagawa Gou
- Center for Microelectronic Systems, Kyushu Institute of Technology, 680-4 Kawazu, Iizuka, Fukuoka 820-8502, Japan
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- Arima Yutaka
- Center for Microelectronic Systems, Kyushu Institute of Technology, 680-4 Kawazu, Iizuka, Fukuoka 820-8502, Japan
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説明
A new physical random-number generator using a metal oxide semiconductor field-effect transistor (MOSFET) whose source and drain are made of Schottky contacts is proposed. MOSFETs, which have PtSi source and drain contacts, are fabricated on a silicon-on-insulator. It was found that large noise appears in the drain current of the PtSi Schottky-source/drain MOSFET when it is operated as an n-channel transistor. The noise spectrum in the frequency range up to 400 kHz shows that the noise is frequency-dependent, which is similar to the noise of a conventional pn-junction MOSFET. A circuit in which an inverter consisting of two Schottky MOSFETs is used as the noise source is proposed to create a random binary signal. The circuit is demonstrated to be able to create a binary signal array whose characteristic is close to a quasi-random number generated by a computer.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 41 (4B), 2306-2311, 2002
The Japan Society of Applied Physics
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キーワード
詳細情報 詳細情報について
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- CRID
- 1390001206256365696
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- NII論文ID
- 110006341154
- 130004529519
- 210000051201
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- NII書誌ID
- AA10457675
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- ISSN
- 13474065
- 00214922
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- NDL書誌ID
- 6154722
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDLサーチ
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