Surface Analysis of Al Alloys with X-ray Photoelectron and Auger Electron Spectroscopies
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- Sakairi Masatoshi
- Faculty of Engineering, Hokkaido University
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- Sasaki Ryo
- Graduate School of Engineering, Hokkaido University
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- Suzuki Keita
- Faculty of Engineering, Hokkaido University
Bibliographic Information
- Other Title
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- X線光電子分光分析やオージェ電子分光分析を用いるAl合金の表面分析
- Xセン コウデン コブン コウブンセキ ヤ オージェ デンシ ブン コウブンセキ オ モチイル Al ゴウキン ノ ヒョウメン ブンセキ
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Abstract
In this paper, X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) were applied to investigate passive films formed on aluminum alloy in 0.5 kmol m-3 H3BO3/0.05 kmol m-3 Na2B4O7 with different metal cations. The metal cation is classified by metal cation hardness, X, which are calculated based on the concept of hard and soft acids and bases (HSAB) of the acid and base in Lewis’s rule. From XPS analysis, the metal cations with X>4 were incorporated in passive films. The area-selected surface analysis of AES was also introduced.
Journal
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- Zairyo-to-Kankyo
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Zairyo-to-Kankyo 64 (7), 281-284, 2015
Japan Society of Corrosion Engineering
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Details 詳細情報について
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- CRID
- 1390001206258283264
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- NII Article ID
- 130005120133
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- NII Book ID
- AN10235427
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- ISSN
- 18819664
- 09170480
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- NDL BIB ID
- 026616227
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed