Modern X-ray Spectroscopy V. Resonant X-ray Scattering
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- MURAKAMI Youichi
- Department of Physics, Graduate School of Science, Tohoku University
Bibliographic Information
- Other Title
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- X線分光の現在 V.共鳴X線散乱
- Xセン ブンコウ ノ ゲンザイ 5 キョウメイ Xセン サンラン
- V. Resonant X-ray Scattering
- V.共鳴X線散乱
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Abstract
Resonant x-ray scattering (RXS) is a very powerful technique to detect the charge distribution and magnetization density with a synchrotron radiation source. Recently this technique has been applied to study charge-, spin-, and orbital-orderings in strongly correlated electron systems. In this paper the cross section and the scattering amplitude of RXS are given on the basis of the interaction between electrons in matter and electromagnetic wave.The atomic scattering factor becomes a tensor instead of a scalar through the resonant process. Charge and orbital orderings of perovskite manganites have been studied using the RXS technique. It is shown that the RXS intensities have characteristics in energy, polarization, and azimuthal angle dependences. Finally an outlook for the RXS technique is briefly mentioned.
Journal
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- Journal of the Spectroscopical Society of Japan
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Journal of the Spectroscopical Society of Japan 57 (5), 254-263, 2008
The Spectroscopical Society of Japan
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Details 詳細情報について
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- CRID
- 1390001206258714496
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- NII Article ID
- 10021874530
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- NII Book ID
- AN00222531
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- ISSN
- 18846785
- 00387002
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- NDL BIB ID
- 9693316
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed