Quantification of Gas-Phase H-Atom Number Density by Tungsten Phosphate Glass

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  • Morimoto Takashi
    School of Materials Science, Japan Advanced Institute of Science and Technology
  • Umemoto Hironobu
    School of Materials Science, Japan Advanced Institute of Science and Technology
  • Yoneyama Koji
    School of Materials Science, Japan Advanced Institute of Science and Technology
  • Masuda Atsushi
    School of Materials Science, Japan Advanced Institute of Science and Technology
  • Matsumura Hideki
    School of Materials Science, Japan Advanced Institute of Science and Technology
  • Ishibashi Keiji
    Advanced Technology Development Division, ANELVA Corporation
  • Tawarayama Hiromasa
    Department of Materials Science and Engineering, Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology
  • Kawazoe Hiroshi
    Kawazoe Frontier Technologies Corporation

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説明

It is shown that H-atom densities in the gas phase can be evaluated by simply measuring the change in optical transmittance of tungsten phosphate glass plates. Tungsten oxide (WO3) doped in phosphate glass plates can be reduced by exposure to H atoms and the degree of reduction can be evaluated from the change in their optical transmittance. The difference in the logarithms of the transmittances before and after the reduction showed a linear dependence on the H-atom density evaluated by a vacuum-ultraviolet laser absorption technique. No change in the transmittance was observed in the absence of H atoms, showing that reduction of WO3 by H2 molecules can be ignored.

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