Transition Behaviour between Erosion and Deposition on a Tungsten Surface Exposed to Deuterium Plasmas Containing Carbon Impurities
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- Hamada Yoshitaka
- Faculty of Enginnering, The University of Tokushima
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- Ebisu Shinji
- Faculty of Enginnering, The University of Tokushima
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- Ohya Kaoru
- Faculty of Enginnering, The University of Tokushima
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Description
The erosion and deposition processes of tungsten (W) exposed to deuterium (D) plasmas containing a small amount (<10%) of carbon (C) ions are investigated by using a dynamic Monte Carlo simulation. The emphasis is placed on an abrupt transition from C deposition to W erosion as the plasma temperature is increased from 10 eV to 100 eV. The transition occurs as a result of little reflection (much deposition) of incident C ions from a C-rich layer and enhanced sputtering of deposited C atoms from a W–C mixed layer. When the deposited C thickness is increased just below the transition temperature, the C emission yield (i.e., the sum of the C reflection coefficient and the C sputtering yield) decreases so that a thick C-rich layer (2–8 μm or more), growing in proportion to the plasma fluence, is formed on W. When the deposited C thickness is decreased above the transition temperature, the C emission yield increases so that there is only a thin W–C mixed layer (100–300 nm), where the depth profile of deposited C is independent of the temperature, fluence and C-concentration of the plasma. The transition is strongly related to the depth profile of the deposited C in the W bulk, therefore, the transition temperature fluctuates according to the erosion and deposition histories and is strongly influenced by the chemical sputtering yield of the deposited C.
Journal
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 43 (9A), 6385-6391, 2004
The Japan Society of Applied Physics
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Details 詳細情報について
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- CRID
- 1390001206265931136
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- NII Article ID
- 10013574604
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- NII Book ID
- AA10457675
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- ISSN
- 13474065
- 00214922
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- NDL BIB ID
- 7080124
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- Text Lang
- en
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed