Effects of the Dopants on the Electrical Properties of the Ni-electrode Ceramic Capacitors.
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- Hitomi Atsushi
- Materials Research Center, TDK Corporation
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- Sato Akira
- Materials Research Center, TDK Corporation
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- Nakano Yukie
- Materials Research Center, TDK Corporation
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- Nomura Takeshi
- Materials Research Center, TDK Corporation
Bibliographic Information
- Other Title
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- Ｎｉ内部電極チップコンデンサの電気的特性に及ぼす微量成分の影響
- Ni ナイブ デンキョク チップ コンデンサ ノ デンキテキ トクセイ ニ オ
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Abstract
Effects of the dopants on the electrical properties of the Ni-electrode multilayer ceramic capacitors have been studied. It is shown that the life time of insulation resistance under Highly Accelerated Life Testing (HALT) become much longer by doping with Y2O3 or V2O5 into dielectrics. There are many dislocation loops in the additive-free dielectric and they disappear by doping with Y2O3. It is supposed that Y plays the role of donar dopant compensating the oxygen vacancies which have a deleterious effect on the life time under HALT.
Journal
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- Journal of the Japan Society of Powder and Powder Metallurgy
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Journal of the Japan Society of Powder and Powder Metallurgy 40 (4), 455-460, 1993
Japan Society of Powder and Powder Metallurgy
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Keywords
Details 詳細情報について
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- CRID
- 1390001206305154048
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- NII Article ID
- 130000819244
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- NII Book ID
- AN00222724
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- ISSN
- 18809014
- 05328799
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- NDL BIB ID
- 3823505
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed
