X-ray Diffraction Data on .KAPPA.-Alumina.

DOI Web Site 11 References

Bibliographic Information

Other Title
  • κ‐アルミナのＸ線回折データについて
  • カッパ アルミナ ノ Xセン カイセツ データ ニ ツイテ

Search this article

Abstract

κ-alumina films were deposited on WC-Co alloy by a CVD method with an under layer of TiC. Powder samples were also prepared by disolving steel sheets on which TiC/Al2O3 or TiC/Al2O3/TiN were deposited. These specimens were examined by X-ray diffraction to obtain more exact diffraction data for practical use.<BR>Diffraction profiles of the films and the powders were analyzed with a hexagonal system. CVD-coated films showed strong orientation, namely c-axis being rectangular to the film plane. κ-Al2O3 has lattice constants of a0=9.632A and c0=8.929A as a hexagonal system. These values correspond to a0=4.816A, b0=8.342A and c0=8.929A of an orthorhombic system.

Journal

References(11)*help

See more

Keywords

Details 詳細情報について

Report a problem

Back to top