Photo-Induced Current between Semiconductor and Metal through Real Contact Area.
Bibliographic Information
- Other Title
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- 光誘起電流による半導体/金属界面の真実接触面の評価の基礎研究
- ヒカリ ユウキ デンリュウ ニ ヨル ハンドウタイ キンゾク カイメン ノ シンジツ セッショクメン ノ ヒョウカ ノ キソ ケンキュウ
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Description
Real contact area between semiconductor and metal is studied by measuring photo induced current (PIC), which is stimulated by laser at the semiconductor surface. Transmittance of PIC from semiconductor to metal interface is discussed. PIC increases proportionally with the increase of normal force between the solids, which implies adhesion like phenomena at the interface. Since PIC is strongly depended on the position of the incidence of light, PIC images, which were obtained with scanning of laser, express the distributions of the real contact area. PIC can be a new method to estimate the interface properties.
Journal
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- TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series C
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TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series C 65 (632), 1677-1683, 1999
The Japan Society of Mechanical Engineers
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Details 詳細情報について
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- CRID
- 1390001206327308672
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- NII Article ID
- 110002384831
- 130004233226
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- NII Book ID
- AN00187463
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- COI
- 1:CAS:528:DyaK1MXktlOiur0%3D
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- ISSN
- 18848354
- 03875024
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- HANDLE
- 10076/8797
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- NDL BIB ID
- 4708674
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- Text Lang
- ja
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- Article Type
- journal article
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- Data Source
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- JaLC
- IRDB
- NDL Search
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed