Lattice deffects in well annealed aluminum revealed by X-Ray topography
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- FURUKAWA Minoru
- Faculty of Education, Fukuoka University of Education
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- MIURA Yasuhiro
- Faculty of Engineering, Kyushu University
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- KAIEDA Hiroya
- Faculty of Engineering, Kyushu University
Bibliographic Information
- Other Title
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- X線回折顕微法による高純度アルミニウムの格子欠陥
- Xセン カイセツ ケンビホウ ニヨル コウ ジュンド アルミニウム ノ コウシ
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Abstract
Aluminum crystals of considerably low dislocation density were obtained through simple isothermal annealing followed by furnace cooling of single crystals grown from the melt. Characterization of lattice defects was made by means of X-ray diffraction topography at room temperature. Most of the dots are revealed to have no single Burgers vector of <110> or <111> type. They probably are dislocations and/or vacancy clusters bound to impurities. It seems that, in a macroscopic scale, some of the rows of prismatic dislocation loops are developed from helical dislocations and others are punched out from certain point sources. The difference in dislocation configuration between the two cases, annealed in air and in vacuum, is attributed to the difference in the nature of oxide layer.
Journal
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- Journal of Japan Institute of Light Metals
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Journal of Japan Institute of Light Metals 29 (5), 179-185, 1979
The Japan Institute of Light Metals
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Details 詳細情報について
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- CRID
- 1390001206339359104
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- NII Article ID
- 130004208084
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- NII Book ID
- AN00069773
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- COI
- 1:CAS:528:DyaE1MXmtVans78%3D
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- ISSN
- 18808018
- 04515994
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- NDL BIB ID
- 2051423
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed