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- 賢志 伊藤
- National Institute of Advanced Industrial Science and Technology
書誌事項
- タイトル別名
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- Positron Annihilation Lifetime Technique as a Sensitive Nanoporosimetry for Membranes
- ヨウデンシ ショウメツ ジュミョウホウ ニ ヨル マク コウゾウ ヒョウカ
- Positron annihilation lifetime technique has been applied to exploring nanoscaled pores/holes in various materials. In recent years, with the help of a variable-energy positron beam it has emerged as a powerful tool for investigating functional thin films fabricated for separation membranes, low-k dielectrics, high performance gas sensors, and so on. This paper overviews briefly the principle of positron annihilation as well as recent progress in nanopore characterization of functional films by means of the positron annihilation lifetime technique.
この論文をさがす
収録刊行物
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- 膜
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膜 38 (1), 17-24, 2013
日本膜学会
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詳細情報 詳細情報について
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- CRID
- 1390001206423461888
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- NII論文ID
- 10031147449
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- NII書誌ID
- AN0023215X
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- COI
- 1:CAS:528:DC%2BC3sXmslCksr0%3D
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- ISSN
- 18846440
- 03851036
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- NDL書誌ID
- 024253502
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles