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- SUZUKI Mineharu
- NTT Interdisciplinary Research Laboratories
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- TAKENAKA Hisataka
- NTT Interdisciplinary Research Laboratories
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- MOGI Kadena
- NTT Advanced Technology Corp.
Bibliographic Information
- Other Title
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- 金属系多層膜を用いた電子の減衰長の測定
Description
We propose a new method for experimentally measuring the electron attenuation length in solid from Auger electron spectroscopic analysis on the aslant-smoothed surface of a metallic multilayer system. The demonstration is performed for the electrons with kinetic energies corresponding to Auger transitions using a ring pattern sputtered surface of Fe and Si02 multilayers. The obtained attenuation lengths are qualitatively in good agreement with the Seah-Dench formalism as well as the TPP-2 formalism for a kinetic energy region of 50 to 1600eV. The experimental values are quantitatively larger than the theoretical ones for Si02, but smaller than those for Fe.
Journal
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- Hyomen Kagaku
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Hyomen Kagaku 16 (8), 492-496, 1995
The Surface Science Society of Japan
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Details 詳細情報について
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- CRID
- 1390001206455947392
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- NII Article ID
- 130003683552
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- ISSN
- 18814743
- 03885321
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- Text Lang
- ja
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- Data Source
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- JaLC
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed