書誌事項
- タイトル別名
-
- Atomic Resolution Secondary Electron Imaging with Aberration Corrected Scanning Transmission Electron Microscope
- キュウメン シュウサ ホセイキ オ トウサイ シタ STEM ニ ヨル ゲンシ ブンカイノウ ニジ デンシゾウ
この論文をさがす
抄録
We innovated the secondary electron (SE) imaging technology with an aberration-corrected scanning transmission electron microscope (STEM). As a result, atomic resolution SE imaging has been achieved for the first time. We have successfully observed isolated single uranium atoms on carbon thin films using the SE signal. In addition, atomic-resolutionSE images were obtained not only from specimens containing heavy elements like uranium but also from those composed of light elements such as silicon and carbon. Because the SE signals are from the upper surface of specimen, imaging atomic lattice for thick specimens of 1 µm was demonstrated. This unique technology provides unprecedented application capabilities including 1) simultaneous atomic-resolution SE/STEM imaging to reveal topographical surface and bulk structure ; 2) simplified specimen preparation requirement for atomic-resolution electron microscopy ; and 3) imaging atomic structure for thicker than 1 µm specimens without having to use a million volt electron microscope.
収録刊行物
-
- 表面科学
-
表面科学 34 (5), 247-252, 2013
公益社団法人 日本表面科学会
- Tweet
キーワード
詳細情報 詳細情報について
-
- CRID
- 1390001206457809408
-
- NII論文ID
- 10031170838
-
- NII書誌ID
- AN00334149
-
- COI
- 1:CAS:528:DC%2BC3sXhsFSktr%2FK
-
- ISSN
- 18814743
- 03885321
-
- NDL書誌ID
- 024664232
-
- 本文言語コード
- ja
-
- データソース種別
-
- JaLC
- NDL
- Crossref
- CiNii Articles
-
- 抄録ライセンスフラグ
- 使用不可