Fabrication of a SiC/Ge-Nanodots Stacked Structure Using Organometallic Compounds

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Other Title
  • 有機金属化合物を用いたSiC/Geナノドット積層構造の作製
  • ユウキ キンゾク カゴウブツ オ モチイタ SiC/Ge ナノドット セキソウ コウゾウ ノ サクセイ

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Description

Ge(GeCx) and SiC(SiCGex) nanodots were formed on Si(001)2o off substrates after the formation of Si c(4×4) structure using monomethylgermane (MMGe). Surface structure of the Ge(GeCx) and SiC(SiCGex) nanodots was measured by scanning tunneling microscopy (STM). From the quantitative analysis of X-ray photoelectron spectroscopy (XPS), it was estimated that the Ge(GeCx) and SiC(SiCGex) nanodots existed in the ratio of about 1 : 2.4. SiC capping layer was formed on the Ge(GeCx), SiC(SiCGex) nanodots generated at 550∼650oC using monomethylsilane (MMSi). Photoluminescence (PL) spectra from the SiC/Ge (GeCx), SiC(SiCGex) dots/SiCx stacked structure were also measured.

Journal

  • Hyomen Kagaku

    Hyomen Kagaku 33 (7), 376-381, 2012

    The Surface Science Society of Japan

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