Fabrication of a SiC/Ge-Nanodots Stacked Structure Using Organometallic Compounds
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- ANEZAKI Yutaka
- Nagaoka University of Technology
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- OTANI Takashi
- Nagaoka University of Technology
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- SUDO Haruki
- Nagaoka University of Technology
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- KATO Takahiro
- Nagaoka University of Technology
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- KATO Ariyuki
- Nagaoka University of Technology
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- SUEMITSU Maki
- Research Institute of Electrical Communication, Tohoku University
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- NARITA Yuzuru
- Yamagata University
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- NAKAZAWA Hideki
- Hirosaki University
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- YASUI Kanji
- Nagaoka University of Technology
Bibliographic Information
- Other Title
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- 有機金属化合物を用いたSiC/Geナノドット積層構造の作製
- ユウキ キンゾク カゴウブツ オ モチイタ SiC/Ge ナノドット セキソウ コウゾウ ノ サクセイ
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Description
Ge(GeCx) and SiC(SiCGex) nanodots were formed on Si(001)2o off substrates after the formation of Si c(4×4) structure using monomethylgermane (MMGe). Surface structure of the Ge(GeCx) and SiC(SiCGex) nanodots was measured by scanning tunneling microscopy (STM). From the quantitative analysis of X-ray photoelectron spectroscopy (XPS), it was estimated that the Ge(GeCx) and SiC(SiCGex) nanodots existed in the ratio of about 1 : 2.4. SiC capping layer was formed on the Ge(GeCx), SiC(SiCGex) nanodots generated at 550∼650oC using monomethylsilane (MMSi). Photoluminescence (PL) spectra from the SiC/Ge (GeCx), SiC(SiCGex) dots/SiCx stacked structure were also measured.
Journal
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- Hyomen Kagaku
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Hyomen Kagaku 33 (7), 376-381, 2012
The Surface Science Society of Japan
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Keywords
Details 詳細情報について
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- CRID
- 1390001206459266304
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- NII Article ID
- 10030824383
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- NII Book ID
- AN00334149
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- ISSN
- 18814743
- 03885321
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- NDL BIB ID
- 023885147
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed