Quantitative Evaluation of Resolution-Level Local-Micro Deformation Based on Three Dimensional Microstructure Images

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  • Kawabe Hirotaka
    Precision and Intelligence Laboratory, Tokyo Institute of Technology
  • Inamura Tomonari
    Precision and Intelligence Laboratory, Tokyo Institute of Technology
  • Hosoda Hideki
    Precision and Intelligence Laboratory, Tokyo Institute of Technology

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  • 三次元材料組織画像に基づく解像度に近い微小変形の定量評価
  • サンジゲン ザイリョウ ソシキ ガゾウ ニ モトズク カイゾウド ニ チカイ ビショウ ヘンケイ ノ テイリョウ ヒョウカ

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Abstract

  In order to quantitative evaluation of micro strain which is close to the resolution of images, a novel evaluation method using three dimensional microstructure images is proposed in this study, especially for the purpose to use in-house micro-focused X-ray tomography apparatus with the resolution of 1-5 μm. The evaluation method is composed of two parts. One is a conventional calculation method to evaluate deformation and the other is a quantitative evaluation of error which is generated by apparatus resolution. By applying this method to NiMnGa/silicone composite under 5% compression strain, 6.4±1 μm deformation of NiMnGa particle is determined under the conditions of 6 specific points and the apparatus resolution of 1.67 μm. Then, the present evaluation method is concluded to be the useful and strong calculation way for the quantitative understanding of resolution-level local-micro deformation, especially based on in-house micro-focused X-ray computed tomography.<br>

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