Fe-Cr合金の不働態皮膜の半導体的性質の光電分極法による解析

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  • Analysis of Semiconductor Properties of Passive Films on Fe-Cr Alloys by Photoelectric Polarization Method
  • Fe Cr ゴウキン ノ フドウタイ ヒマク ノ ハンドウタイテキ セイシツ

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Photocurrent iph vs. potential E and quantum efficiency φ vs. photon energy hω curves were measured on passive films of Fe-Cr alloys, pure Fe and pure Cr in neutral Na2SO4 solutions. The same kinds of measurement were conducted on thin films of γ- and α-Fe2O3, Cr2O3, NiO, and composite oxides of Fe2O3-Cr2O3 formed on Pt using MO-CVD technique. Conduction types and bandgaps of the passive films were examined based on the characteristics of these curves, comparing them with the results from the thin films.<BR>It was found that the passive films on pure Fe and Fe-Cr alloys containing 5 to 20 mass%Cr had n-type conduction and those on the alloys containing 30 to 80 mass%Cr and pure Cr had p-type conduction. Bandgaps of the passive films formed at 0.4 V on the former group increased from 2.28 eV for pure Fe to 2.66 eV for Fe-19 mass%Cr alloy with increasing Cr content. The results on the thin films formed by MO-CVD showed that their thickness did not affect the feature of iph vs. E and φ vs. hω curves but the magnitude of iph. The conduction type and the bandgap of the composite oxide films changed with their cationic mass fractions of Cr3+ ions, XCr. That is, the films of XCr<0.5 had n-type conduction and their bandgaps increased from 2.25 eV for XCr0=(γ-Fe2O3) to 2.48 eV for XCr=0.42, whereas those of XCr>0.8 p-type conduction. The changes in conduction type and bandgap of the passive films on Fe-Cr alloys can be explained from these results of the composite oxide films.

収録刊行物

  • 日本金属学会誌

    日本金属学会誌 49 (8), 640-649, 1985

    公益社団法人 日本金属学会

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