Probe Measurements: Fundamentals to Advanced Applications
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- AMEMIYA Hiroshi
- Faculty of Engineering, Graduate School of Chuo University
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- WADA Motoi
- Faculty of Engineering, Doshisha University
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- TOYODA Hirotaka
- Graduate School of Engineering, Nagoya University
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- NAKAMURA Keiji
- Department of Electrical Engineering, Chubu University
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- ANDO Akira
- Department of Electrical Engineering, Tohoku University
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- UEHARA Kazuya
- Naka Fusion Research Establishment, JAERI
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- OYAMA Koh-ichiro
- Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency
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- SAKAI Osamu
- Graduate School of Engineering, Kyoto University
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- TACHIBANA Kunihide
- Graduate School of Engineering, Kyoto University
Bibliographic Information
- Other Title
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- プローブ計測の基礎から応用まで
- シュウチュウ コウザ プローブ ケイソク ノ キソ カラ オウヨウ マデ
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Abstract
This intensive course gives fundamentals of probe measurement and its advanced applications. The first part reviews the theory of the electrostatic probe used in the plasma and methods for determining plasma parameters (space potential, electron temperature, plasma density, energy distribution, etc.). Several types of conventional probes are presented. The second part presents new methods and techniques that have been developed to measure complicated cases: electronegative plasma, flowing plasma, strongly magnetized (fusion) plasma, space plasma and (high pressure) microplasma by giving some examples.
Journal
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- Journal of Plasma and Fusion Research
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Journal of Plasma and Fusion Research 81 (7), 482-525, 2005
The Japan Society of Plasma Science and Nuclear Fusion Research
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Keywords
- electrostatic probe
- electron temperature
- ion temperature
- plasmas density
- space potential
- electron energy distribution
- Mach probe
- plasma oscillation probe
- surface wave probe
- bias-optical probe
- plasma flow
- negative ion
- photodetachment
- electron-beam
- high energy tail
- high pressure
- microplasma
- reactive plasma
- fusion plasma
- space plasma
- ionosphere
- plasma display
- sheath
Details 詳細情報について
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- CRID
- 1390001206513152512
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- NII Article ID
- 110006281949
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- NII Book ID
- AN10401672
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- COI
- 1:CAS:528:DC%2BD2MXps1Citbc%3D
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- NDL BIB ID
- 7434784
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- ISSN
- 09187928
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- Data Source
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- JaLC
- NDL
- Crossref
- NDL-Digital
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed