Effect of secondary fluorescence on electron microprobe analysis of Fe in plagioclase.

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  • SUGAWARA Toru
    Department of Earth and Planetary Sciences, Tokyo Institute of Technology Present address: Department of Chemistry, Faculty of Science, Gakushuin University

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  • ＥＰＭＡによる斜長石中のＦｅ分析で生ずる二次蛍光効果について
  • EPMA ニ ヨル シャ チョウセキ チュウ ノ Fe ブンセキ デ ショウズル 2ジ ケイコウ コウカ ニ ツイテ

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Abstract

In EPMA analysis of plagioclase in common igneous rocks, measured Fe content can be over-estimated by 15-50 % due to the effect of secondary fluorescence in Fe-bearing adjoining phase such as tholeiitic glass and fayalite, when distance between the analyzed point in plagioclase and adjoining phase is less than 40 μm. The present study reports empirical correction equation for measurements of Fe content in the plagioclase based on new experimental data. The magnitude of the over-estimation of Fe in plagioclase is larger than that of Ca in olivine. It is necessary to analyze carefully with respect to the chemical composition of adjoining phases and distance from the interface for quantitative measurements of Fe in plagioclase and Ca in olivine.

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