ＸＰＳ（ＥＳＣＡ）による鉱物の表面分析技術
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- 八田 珠郎
- 農林水産省 国際研究センター
書誌事項
- タイトル別名
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- Surface Analysis Techniques of Minerals by XPS(ESCA).
説明
The latest X-ray photoelectron spectroscopy (XPS), employing several devices for better charge neutralization on the mineral surface, provides surface compositional, oxidation state and structural information. This sensitive system functions as a probe to invesitgate the electron binding energy except for photoelectron ejection from H and He atoms. The static charge referencing techniques by several internal standards, the gold decoration, and bridging-masking methods of using electrically conductive adhesive tape or gold wire are sample preparations available for maximizing the neutralization on the surface of non-conducting minerals. Special notice of data treatment is directed to the orbital map drawn by high resolution XPS.
収録刊行物
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- 鉱物学雜誌
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鉱物学雜誌 26 (4), 198-202, 1997
一般社団法人 日本鉱物科学会
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詳細情報 詳細情報について
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- CRID
- 1390001206526274432
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- NII論文ID
- 130003437009
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- ISSN
- 18837018
- 04541146
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可
