Image Simulation for High-Resolution Electron Microscopy

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  • 高分解能電子顕微鏡像のシミュレーション
  • コウブンカイノウ デンシ ケンビキョウゾウ ノ シミュレーション

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Abstract

<p>Both (Conventional) Transmission Electron Microscopy (CTEM) and Scanning Transmission Electron Microscopy (STEM) give atomic resolution images under optimum conditions. However, in order to confirm the proposed structure based on the micrographs we need image simulation. Image simulation program will give some images, when we provide sample information and imaging conditions. However, CTEM and STEM images are generated from different signals, and the effect of the objective lens differs between two imaging modes. Thus, in order to evaluate the simulated images we have to understand the fundamental ideas as well as basic concepts of image simulation. In this article, I will explain, based on the multislice method, the fundamentals of high-resolution image simulation, especially the techniques to estimate elastic and thermal diffuse scattering and to handle partial coherence.</p>

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  • KENBIKYO

    KENBIKYO 50 (1), 11-15, 2015-04-30

    The Japanese Society of Microscopy

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