Atmospheric Scanning Electron Microscope System with an Open Sample Chamber

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  • 大気に開放された試料室を持つ大気圧走査電子顕微鏡の開発
  • タイキ ニ カイホウ サレタ シリョウシツ オ モツ タイキアツ ソウサ デンシ ケンビキョウ ノ カイハツ

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Abstract

<p>Basic designs and recent developments of an atmospheric scanning electron microscope (ASEM) system and optical microscope (OM) are reported. Samples are in liquid or gas at atmospheric pressure on the electron-transparency window of the open ASEM dish which is sealed to the top of an inverted SEM column. OM is placed above the dish. The improved system has (i) a fully motorized sample stage, (ii) a column protection system in case of accidental window breakage, and (iii) an OM/SEM operation system controlled by a graphical user interface. The open sample chamber allows the external administration of reagents to the sample during SEM observation, and the study of systems involving volume changes. Taking advantage of this, we monitored the influence of NaCl on the random motion of silica particles in liquid.</p>

Journal

  • KENBIKYO

    KENBIKYO 49 (1), 3-6, 2014-04-30

    The Japanese Society of Microscopy

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