Application of Direct Electron Detector for TEM

DOI 11 References

Bibliographic Information

Other Title
  • 電子直接検出カメラ（direct electron detector）のTEMへの応用

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Description

<p>Direct electron detector (DED) cameras using CMOS image sensor are developed and used as an imaging media in transmission electron microscope (TEM). Since images recorded in DED show higher spatial resolution and better signal to noise ratio than those in CCD, it is applied to low dose imaging, especially for cryo-electron microscopy. The fast readout speed of DED is also used to a time-lapse recording and a specimen drift correction. In this article, we describe the principle and the performance of DED, and introduce the recent applications.</p>

Journal

  • KENBIKYO

    KENBIKYO 48 (1), 57-60, 2013-04-30

    The Japanese Society of Microscopy

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Details 詳細情報について

  • CRID
    1390001277348022272
  • NII Article ID
    10031176532
  • NII Book ID
    AA11917781
  • DOI
    10.11410/kenbikyo.48.1_57
  • ISSN
    24342386
    13490958
  • Text Lang
    ja
  • Article Type
    journal article
  • Data Source
    • JaLC
    • CiNii Articles
    • KAKEN
  • Abstract License Flag
    Disallowed

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