Mechanical property measurements on nanoscale
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- YAMANAKA Kazushi
- New Industry Creation Hatchery Center, Tohoku University
Bibliographic Information
- Other Title
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- ナノ領域の力学特性計測
- ナノ リョウイキ ノ リキガク トクセイ ケイソク
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Abstract
<p>With the popularization of nanotechnology, mechanical property measurements on the nanoscale have gained much attention. In this article, I describe the principle of various measurements in acoustic force microscopy, which has been developed for this purpose. Then I show applications of the acoustic force microscopy to subsurface defect evaluation in microdevices and the mechanical property characterization of ferroelectric domains.</p>
Journal
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- Oyo Buturi
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Oyo Buturi 76 (7), 751-757, 2007-07-10
The Japan Society of Applied Physics
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Keywords
Details 詳細情報について
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- CRID
- 1390001277358897664
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- NII Article ID
- 10019516694
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- NII Book ID
- AN00026679
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- ISSN
- 21882290
- 03698009
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- NDL BIB ID
- 8882817
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- CiNii Articles
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- Abstract License Flag
- Disallowed