放射光X線粉末回折による確度の高い構造因子の計測および未知構造決定

西堀 英治

doi:10.5940/jcrsj.60.88

放射光X線粉末回折による確度の高い構造因子の計測および未知構造決定

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西堀英治

筑波大学数理物質系

書誌事項

タイトル別名

Synchrotron X-ray Powder Diffraction Studies of Accurate Structure-Factors Measurement and <i>Ab Initio</i> Structure Determination
学会賞受賞論文放射光X線粉末回折による確度の高い構造因子の計測および未知構造決定
ガッカイショウジュショウロンブンホウシャコウ Xセンフンマツカイセツニヨルカクドノタカイコウゾウインシノケイソクオヨビミチコウゾウケッテイ

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説明

<p>Our synchrotron radiation（SR）X-ray powder diffraction studies of accurate structure factors measurement and ab-initio structure determination during past couple of decades have been described with some details. These studies were carried out using SR powder profiles measured at SPring-8. This paper organized as follows：First the performance and an advantage of powder diffraction profile measured at SPring-8. Second, accurate structure factors measurement using SPring-8 together with recent topics. Third, we introduced the strong point of SPring-8 data for structure determination from powder diffraction with some examples. Finally, I will describe summary of this paper.</p>