P2-17 X-ray analysis of SAW-semiconductor coupled devices
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- Nakajima T.
- Faculty of Engineering, Kanagawa Institute of Technology
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- Miyadai K.
- Faculty of Engineering, Kanagawa Institute of Technology
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- Kaneshiro C.
- Faculty of Engineering, Kanagawa Institute of Technology
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- Aoki Y.
- Faculty of Engineering, Kanagawa Institute of Technology
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- Koh K.
- Faculty of Engineering, Kanagawa Institute of Technology
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- Hohkawa K.
- Faculty of Engineering, Kanagawa Institute of Technology
Bibliographic Information
- Other Title
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- P2-17 半導体/圧電体結合素子のX線回折によるトポグラフィック評価(ポスターセッション2,ポスター発表)
Journal
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- Proceedings of Symposium on Ultrasonic Electronics
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Proceedings of Symposium on Ultrasonic Electronics 22 (0), 205-206, 2001-11-07
Institute for Ultrasonic Elecronics
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Details 詳細情報について
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- CRID
- 1390001288093606400
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- NII Article ID
- 110007464250
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- ISSN
- 24331414
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- Text Lang
- ja
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- Data Source
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- JaLC
- CiNii Articles