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Effects of Solid Dielectric Material and Compressive Force on Interfacial AC Breakdown Voltage between Two Solid Dielectrics
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- Osawa Naoki
- Kanazawa Institute of Technology
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- Masui Hidetaka
- Kanazawa Institute of Technology
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- Aoshima Moriyuki
- Kanazawa Institute of Technology
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- Imai Ryuta
- Kanazawa Institute of Technology
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- Moribayashi Takumi
- Kanazawa Institute of Technology
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- Yoshioka Yoshio
- Kanazawa Institute of Technology
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- Yanase Hironori
- Fuji Electric Co., Ltd.
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- Okamoto Kenji
- Fuji Electric Co., Ltd.
Bibliographic Information
- Other Title
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- 固体絶縁物接続部の界面における絶縁破壊特性
- 固体絶縁物接続部の界面における絶縁破壊特性 : 樹脂の種類と面圧の影響
- コタイ ゼツエンブツ セツゾクブ ノ カイメン ニ オケル ゼツエン ハカイ トクセイ : ジュシ ノ シュルイ ト メンアツ ノ エイキョウ
- -樹脂の種類と面圧の影響-
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Description
<p>One of the weak points of all solid insulation system is the breakdown strength along the interface between two solid dielectrics. The low breakdown voltage is considered to be due to the small cavities formed in the interface due to surface morphology. In this paper, we investigated the effects of dielectric material and compressive force on interfacial breakdown voltages. The results that we obtained are as follows: (1) most of the interfacial breakdowns between two solid dielectrics were developed by avoiding the contact area for high-pressure region, (2) in cases of polymethyl methacrylate (PMMA) and high-density polyethylene (HDPE), the breakdown voltages increased with increasing the compressive force, (3) mechanically soft insulating material was found to be better than hard material, because cavities existed between two solid dielectrics by compressive force become small, and (4) although the same compressive force was applied to the interface, the breakdown voltages increased with increasing uniformity of the surface.</p>
Journal
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- IEEJ Transactions on Fundamentals and Materials
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IEEJ Transactions on Fundamentals and Materials 139 (3), 147-153, 2019-03-01
The Institute of Electrical Engineers of Japan
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Keywords
Details 詳細情報について
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- CRID
- 1390001288124838144
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- NII Article ID
- 130007605806
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- NII Book ID
- AN10136312
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- ISSN
- 13475533
- 03854205
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- NDL BIB ID
- 029552426
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL Search
- Crossref
- CiNii Articles
- OpenAIRE
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- Abstract License Flag
- Disallowed