Biomaterial Surface and Interface Analysis by Means of Time-of-Flight Secondary Ion Mass Spectrometry

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  • TOF-SIMSによるバイオ表面・界面分析の最近の成果
  • TOF-SIMS ニ ヨル バイオ ヒョウメン ・ カイメン ブンセキ ノ サイキン ノ セイカ

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<p>Thanks to the development of gas cluster ion beam (GCIB) such as an Ar cluster ion beam, the application of TOF-SIMS has been growing, especially in biological fields. GCIB enables sputtering of soft materials including biological cells and tissues to provide 3D images. The features of the latest TOF-SIMS related techniques and applications of TOF-SIMS into biological samples, such as hair, skin, cells, and tissues, and bio-model samples for biomolecule investigation are briefly introduced in this article.</p>

Journal

  • Vacuum and Surface Science

    Vacuum and Surface Science 62 (4), 211-216, 2019-04-10

    The Japan Society of Vacuum and Surface Science

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