Magnetostriction Measurement System of Magnetic Thin Films with Michelson Interference

DOI
  • Sato M.
    Graduate School of Science and Engineering, Yamagata Univ.
  • Yoshida Y.
    Graduate School of Science and Engineering, Yamagata Univ.
  • Suzuki T.
    Graduate School of Science and Engineering, Yamagata Univ.
  • Takahashi Y.
    Graduate School of Science and Engineering, Yamagata Univ.
  • Koike K.
    Graduate School of Science and Engineering, Yamagata Univ.
  • Inaba N.
    Graduate School of Science and Engineering, Yamagata Univ.

Bibliographic Information

Other Title
  • マイケルソン光干渉法による磁歪測定装置の作製

Description

<p>  We developed a sensitive magnetostriction measurement system of magnetic thin film specimens using a Michelson interference. When magnetic field is applied parallel to the film plane of the cantilevered specimen, the magnetostriction of the film makes the specimen slightly bend, and the movement of the interference patterns is observed depending on the deflection d of the specimen. Variation of d can be detected with the precision of about one hundredth of wavelength of laser beam. The magnetostriction constant λ110 of Fe(001) single crystal thin film deposited on MgO(001) single crystal substrate with film thickness of 61 nm was estimated to be (1. 4±0.27)×10-5 from the deflection of 2.6±0.5 nm.</p>

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Keywords

Details 詳細情報について

  • CRID
    1390001288135337472
  • NII Article ID
    130007641609
  • DOI
    10.20819/msjtmsj.19tr308
  • ISSN
    24320471
  • Text Lang
    en
  • Data Source
    • JaLC
    • CiNii Articles
  • Abstract License Flag
    Disallowed

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