マイケルソン光干渉法による磁歪測定装置の作製
書誌事項
- タイトル別名
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- Magnetostriction Measurement System of Magnetic Thin Films with Michelson Interference
説明
<p> We developed a sensitive magnetostriction measurement system of magnetic thin film specimens using a Michelson interference. When magnetic field is applied parallel to the film plane of the cantilevered specimen, the magnetostriction of the film makes the specimen slightly bend, and the movement of the interference patterns is observed depending on the deflection d of the specimen. Variation of d can be detected with the precision of about one hundredth of wavelength of laser beam. The magnetostriction constant λ110 of Fe(001) single crystal thin film deposited on MgO(001) single crystal substrate with film thickness of 61 nm was estimated to be (1. 4±0.27)×10-5 from the deflection of 2.6±0.5 nm.</p>
収録刊行物
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- 日本磁気学会論文特集号
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日本磁気学会論文特集号 3 (1), 39-42, 2019-05-01
公益社団法人 日本磁気学会
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詳細情報 詳細情報について
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- CRID
- 1390001288135337472
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- NII論文ID
- 130007641609
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- ISSN
- 24320471
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可