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- Bannno Kihachiro
- Daio Engineering Corporation
Bibliographic Information
- Other Title
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- 最新型近赤外線式カラー欠陥検査装置導入事例
- サイシンガタ キン セキガイセンシキ カラー ケッカン ケンサ ソウチ ドウニュウ ジレイ
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Description
<p>The defect detection device of Marubishi Paper Tech Co., Ltd. was updated to Omronʼs latest type Near Infrared Color Defect Detector.</p><p>Since the conventional defect inspection device was a combined refl ection and transmission method, it was necessary to adjust the balance between the amount of refl ected light and the amount of transmitted light for each product type.</p><p>Therefore, by adopting the color refl ection/NIR transmission independent system, there is no interference of light, adjustment of light quantity becomes easy, and highly accurate inspection can be performed stably.</p><p>This makes it possible to detect minute foreign substances, etc., and is useful for improving the quality of products.</p>
Journal
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- JAPAN TAPPI JOURNAL
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JAPAN TAPPI JOURNAL 73 (3), 218-221, 2019
JAPAN TECHNICAL ASSOCIATION OF THE PULP AND PAPER INDUSTRY
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Details 詳細情報について
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- CRID
- 1390001288141319936
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- NII Article ID
- 130007657330
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- NII Book ID
- AN00379952
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- ISSN
- 18811000
- 0022815X
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- NDL BIB ID
- 029544046
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed