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- Ichii Takashi
- 京都大学大学院工学研究科材料工学専攻
Bibliographic Information
- Other Title
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- 高粘度イオン液体中における原子分解能AFMイメージング
- コウネンド イオン エキタイ チュウ ニ オケル ゲンシ ブンカイノウ AFM イメージング
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Abstract
<p>Frequency modulation atomic force microscopy (FM-AFM) imaging in ionic liquids (ILs) was carried out. A quartz tuning fork sensor with a sharpened tip was used as a force sensor instead of a Si cantilever and only the tip apex was immersed in ILs. The quality factor of the sensors was kept high even in the viscous ILs, which improved the stability and the force sensitivity. Atomic-resolution topographic imaging was successfully achieved in ILs as well as in an aqueous solution. In addition, 1-dimensional force curve measurement and 2-dimensional force mapping were carried out, which revealed the interfacial structure on the IL/solid interfaces.</p>
Journal
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- KENBIKYO
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KENBIKYO 51 (2), 78-82, 2016-08-30
The Japanese Society of Microscopy
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Keywords
Details 詳細情報について
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- CRID
- 1390001288158049920
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- NII Article ID
- 130007695963
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- NII Book ID
- AA11917781
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- ISSN
- 24342386
- 13490958
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- NDL BIB ID
- 027635644
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- CiNii Articles
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- Abstract License Flag
- Disallowed