Theory and Application of Atomic-Resolution Annular Bright-Field (ABF) STEM

DOI Web Site 2 Citations 22 References
  • Shibata Naoya
    東京大学大学院工学系研究科総合研究機構 科学技術振興機構　さきがけ研究員
  • Findlay Scott D.
    東京大学大学院工学系研究科総合研究機構
  • Ikuhara Yuichi
    東京大学大学院工学系研究科総合研究機構 ファインセラミックスセンター　ナノ構造研究所

Bibliographic Information

Other Title
  • 環状明視野（ABF）STEM法の理論と応用
  • カンジョウメイシヤ ABF STEMホウ ノ リロン ト オウヨウ

Search this article

Abstract

<p>Light elements are of central importance in a wide range of materials and devices. However, direct imaging of light elements at atomic resolution has been an outstanding challenge for the popular and otherwise highly successful technique of scanning transmission electron microscopy. Recently, a new imaging mode, called annular bright field (ABF) imaging, has been found to give direct and robust imaging of both light and heavy elements simultaneously.This new imaging mode is reviewed and compared with other scanning transmission electron microscopy imaging modes.The basic principles of image formation are discussed, with particular emphasis on what makes light elements visible. Example applications, including the direct visualization of hydrogen within a crystalline environment, are presented.</p>

Journal

  • KENBIKYO

    KENBIKYO 46 (1), 55-60, 2011-03-30

    The Japanese Society of Microscopy

Citations (2)*help

See more

References(22)*help

See more

Keywords

Details 詳細情報について

Report a problem

Back to top