書誌事項
- タイトル別名
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- Exploration of the Method of EEG Feedback for Enhancing Memory
説明
<p>This paper reports the relationship between electroencephalogram (EEG) and working memory . In the conventional measurement of EEG, we have used the wet electrode. Therefore, it is needed to grind of stratum corneum and apply electrolyte paste. This process gives the subjects discomfort and takes a lot of time for experiments. In oreder to solve these problems, we developed dry microneedle electrodes which can measure EEG without pretreatment. In this study, we measured EEG with dry microneedle electrodes during doing the memory test we made. The memory test consists of learning process and remembering process. We discovered the power spectrum density of θwave becomes higher in the process of remembering process than learning process. However, we cannot see the correlation between the result of the memory test and power spectrum density.</p>
収録刊行物
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- マイクロ・ナノ工学シンポジウム
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マイクロ・ナノ工学シンポジウム 2019.10 (0), 20pm3PN352-, 2019
一般社団法人 日本機械学会
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詳細情報 詳細情報について
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- CRID
- 1390003825182991488
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- NII論文ID
- 130007846920
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- ISSN
- 24329495
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
- OpenAIRE
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- 抄録ライセンスフラグ
- 使用不可