Observation Experiment of Material Dynamics under Laser-Shock Compression with In-situ Real Time X-ray Diffraction

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  • その場実時間X線回折によるレーザー衝撃圧縮下の 物質ダイナミクス観測実験
  • ソノ バ ジツジカン Xセン カイセツ ニ ヨル レーザー ショウゲキ アッシュク カ ノ ブッシツ ダイナミクス カンソク ジッケン

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Abstract

We performed measurement of laser-shock compressed silicon along [001] orientation using in-situ wide-angle x-ray diffraction technique and line-imaging velocimetry (VISAR). The x-ray diffraction detector fi lm recorded x-rays that are diffracted from multiple lattice planes. These diffracted x-rays indicate uncompressed state and compressed state. VISAR interferometry image shows a specifi c rearsurface velocity change indicating that a shock wave propagate in the silicon target. These data provide information on the crystal structure and stress state under shock compression.

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