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Automatic Threshold Estimation from Photoelectron Yield Spectroscopy (PYS) - Automatic Estimation of Analysis Range by Residual Analysis -
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- Yagyu Shinjiro
- National Institute for Materials Science
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- Yoshitake Michiko
- National Institute for Materials Science
Bibliographic Information
- Other Title
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- 電子収量分光(PYS)スペクトルからの自動閾値推定 -残差分析による自動分析範囲の推定-
- デンシ シュウリョウ ブンコウ(PYS)スペクトル カラ ノ ジドウ イキチ スイテイ : ザンサ ブンセキ ニ ヨル ジドウ ブンセキ ハンイ ノ スイテイ
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Description
We have developed a mathematical automatic estimation algorithm for deriving the ionization potential from photoelectron yield spectroscopy (PYS). The residuals between the regression line and the data obtained by the Fowler model were calculated by the mean absolute error (MAE) and the mean square root error (RMSE). The analytical range that the Fowler model can be applied is estimated by using the ratio of RMSE/MAE. The estimation was performed by this algorithm using the 87 verification datasets. The correct answer rate was improved to 79% than the conventional fitting (least square method) rate of less than 50%.
Journal
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- Journal of Surface Analysis
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Journal of Surface Analysis 27 (1), 15-21, 2020
The Surface Analysis Society of Japan
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Details 詳細情報について
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- CRID
- 1390007437192683648
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- NII Article ID
- 130008070315
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- NII Book ID
- AA11448771
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- ISSN
- 13478400
- 13411756
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- NDL BIB ID
- 030705407
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL Search
- Crossref
- CiNii Articles
- OpenAIRE
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- Abstract License Flag
- Disallowed