PTFEを装荷した平衡形円板共振器を用いたマイクロ波・ミリ波帯における中損失基板の厚み方向複素誘電率測定

DOI Web Site Web Site 参考文献6件

書誌事項

タイトル別名
  • Measurement of Complex Permittivity normal to Substrates for Medium-loss Materials Using a PTFE Loaded Balanced-type Circular Disk Resonator at Microwave and Millimeter Wave Frequencies
  • PTFE オ ソウカ シタ ヘイコウケイ エンバン キョウシンキ オ モチイタ マイクロハ ・ ミリ ハタイ ニ オケル チュウ ソンシツ キバン ノ アツミ ホウコウフクソ ユウデンリツ ソクテイ

この論文をさがす

抄録

<p>The complex permittivity normal to substrates can be measured by the balanced-type circular disk resonator method at microwave and millimeter wave frequencies. However, in the case of substrates for medium-loss materials with a dielectric loss tangent of about 10-2 and thickness of 1mm or less, the unloaded Q of the resonator decreases to about several tens, causing distortion in the resonance response. Therefore, it becomes difficult to measure the complex permittivity accurately. In this paper, we propose a polytetrafluoroethylene (PTFE) sheet loaded balanced-type circular disk resonator. By loading PTFE sheet, the distance between the conductors of the resonator is widened, and in addition, the concentration of electric field energy into the dielectric sample is weakened adequately, so that the unloaded Q of the resonator increases. The availability of this method is verified by measuring the frequency dependence of the complex permittivity of the FR4 substrate from 5 to 30 GHz.</p>

収録刊行物

参考文献 (6)*注記

もっと見る

キーワード

詳細情報 詳細情報について

問題の指摘

ページトップへ