書誌事項
- タイトル別名
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- Essential Structure of <i>S-N</i> Curve and the Essence of Scatter of Fatigue Life
- 金属疲労S-N曲線の基本構造と疲労寿命のばらつきの本質
- キンゾク ヒロウ S-N キョクセン ノ キホン コウゾウ ト ヒロウ ジュミョウ ノ バラツキ ノ ホンシツ
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説明
<p>Historically, S-N curve has been expressed in the form of an exponential relationship between applied stress σ and number of cycles to failure Nf regardless of scatter of data. This paper elucidates the essential structure of S-N curve and the causes of scatter of fatigue life and fatigue limit based on the prediction model for materials containing various defects. The validity of the model was verified by testing specimens containing small defects with various sizes and by analyzing the difference of failure lives due to defect size. The model was successfully applied to the data reported by other researchers. It was revealed that the statistical nature of the scatter of fatigue data should be expressed by the statistics of extremes, because the source of the scatter is originated from the largest defect contained in specimens.</p>
収録刊行物
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- 材料
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材料 70 (12), 881-888, 2021-12-15
公益社団法人 日本材料学会
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詳細情報 詳細情報について
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- CRID
- 1390008998107611264
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- NII論文ID
- 130008131150
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- NII書誌ID
- AN00096175
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- ISSN
- 18807488
- 05145163
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- NDL書誌ID
- 031879514
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDLサーチ
- Crossref
- CiNii Articles
- OpenAIRE
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- 抄録ライセンスフラグ
- 使用不可